In-situ Transport Measurement Stage is a product line developed to enable smart and efficient in-situ electronic/magnetic transport measurement.
Combining with an In-situ Device Fabricator, patterned devices can be directly grown on the sample surface. With an integrated XYZ nano positioner, a 4-point or 6-point spring-leg probe (or Reflect-type Mutual Inductance Probe) can land on different devices/areas on the surfaces and perform electronic/magnetic transport measurement. Different probes can be switched in situ. Standard flag type sample holder, Elmitec LEEM holder or user-customized holders are accepted. The whole system is ultrahigh vacuum and low temperature compatible.
